THE STUDY OF ELECTROMECHANICAL BUCKLING AND PULL-IN INSTABILITIES OF ELECTROSTATICALLY ACTUATED MICROBEAMS

被引：0
|
作者：
Zhang, Jin [1 ]
机构：
[1] Harbin Inst Technol, Shenzhen Grad Sch, Shenzhen 518055, Peoples R China
来源：
PROCEEDINGS OF THE 7TH INTERNATIONAL CONFERENCE ON MECHANICS AND MATERIALS IN DESIGN (M2D2017) | 2017年
基金：
中国国家自然科学基金;
关键词：
microbeam; variational iteration method; electromechanical buckling;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The electromechanical buckling (EMB) and pull-in instabilities of electrostatically actuated microbeam-based microelectromechanical systems have been investigated in this paper. Specifically, analytic solutions to the static deflections of these systems have been obtained using the variational iteration method (VIM). A good agreement between the present analytic results with finite element method results indicates that VIM can be utilized to study the EMB and the pull-in instabilities of the electrostatically actuated microbeam even when the influence of mid-plane stretching is considerable.
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页码：677 / 678
页数：2
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