共 50 条
- [22] Photoacoustic imaging of voids in direct wafer bonding [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (04): : 1869 - 1872
- [24] Surface Characterization for and by Semiconductor Wafer Direct Bonding [J]. SEMICONDUCTOR WAFER BONDING 13: SCIENCE, TECHNOLOGY, AND APPLICATIONS, 2014, 64 (05): : 133 - 140
- [26] Wafer contamination protection by direct wafer bonding and air jet debonding [J]. SEMICONDUCTOR WAFER BONDING: SCIENCE, TECHNOLOGY, AND APPLICATIONS V, PROCEEDINGS, 2001, 99 (35): : 195 - 199
- [28] Advanced Dicing Technologies for Combination of Wafer to Wafer and Collective Die to Wafer Direct Bonding [J]. 2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019, : 437 - 445
- [30] Characterization and mitigation of local wafer deformations introduced by direct wafer-to-wafer bonding [J]. NOVEL PATTERNING TECHNOLOGIES 2024, 2024, 12956