Development and validation method for the determination of rare earth impurities in high purity neodymium oxide by ICP-MS

被引:0
|
作者
He, M [1 ]
Hu, B [1 ]
Jiang, ZC [1 ]
Zeng, Y [1 ]
机构
[1] Wuhan Univ, Dept Chem, Wuhan 430072, Peoples R China
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中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The analytical procedure for the determination of trace rare earth impurities in high purity neodymium oxide (Nd2O3) by ICP-MS is described. The effect of ICP-MS operating parameters on the REO(H)(+)/RE+ production ratio was studied in detail, and the optimal ICP operating conditions were established. In this context, the relationship between REO(H)(+)/RE+ production ratio and the bond strength of the rare earth oxides is also discussed briefly. For the correction of the spectral interference induced by the matrix (neodymium), a simple correction equation was used for correcting the interferences of the polyatomic ions NdO+ and NdOH+ with Tb-159 and Ho-165. The proposed method was applied to the determination of trace rare earth impurities in high purity Nd2O3\, and the analytical results were in good agreement with the recommended reference values.
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页码:13 / 20
页数:8
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