Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002

被引:7
|
作者
Morimura, Takao [1 ]
Hasaka, Masayuki [2 ]
Kondo, Shin-ichiro [2 ]
机构
[1] Nagasaki Univ, Grad Sch Sci & Technol, Nagasaki 8528521, Japan
[2] Nagasaki Univ, Dept Mat Sci & Engn, Fac Engn, Nagasaki 8528521, Japan
关键词
high-resolution electron microscopy; half-Heusler phase; melt spinning; X-ray diffraction; thermoelectric material;
D O I
10.1016/j.scriptamat.2008.06.039
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The high-performance thermoelectric compound Ti-0.5(Zr0.5Hf0.5)(0.5)NiSn0.998Sb0.002 with half-Heusler lattice was studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Each half-Heusler peak in the XRD pattern was accompanied by a bump at the high-angle side. Granular domains, a few nanometers in size, were observed in a bright-field TEM image. Fourier transformation and inverse Fourier transformation of the high-resolution TEM image revealed that the granular structure consists of half-Heusler domains with ordering and with disordering between second nearest neighbor atoms. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:886 / 888
页数:3
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