Transmission electron microscopy observation of the half-Heusler compound Ti0.5(Zr0.5Hf0.5)0.5NiSn0.998Sb0.002

被引：7
|
作者：
Morimura, Takao [1 ]
Hasaka, Masayuki [2 ]
Kondo, Shin-ichiro [2 ]
机构：
[1] Nagasaki Univ, Grad Sch Sci & Technol, Nagasaki 8528521, Japan
[2] Nagasaki Univ, Dept Mat Sci & Engn, Fac Engn, Nagasaki 8528521, Japan
来源：
SCRIPTA MATERIALIA | 2008年 / 59卷 / 08期
关键词：
high-resolution electron microscopy; half-Heusler phase; melt spinning; X-ray diffraction; thermoelectric material;
D O I：
10.1016/j.scriptamat.2008.06.039
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The high-performance thermoelectric compound Ti-0.5(Zr0.5Hf0.5)(0.5)NiSn0.998Sb0.002 with half-Heusler lattice was studied by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Each half-Heusler peak in the XRD pattern was accompanied by a bump at the high-angle side. Granular domains, a few nanometers in size, were observed in a bright-field TEM image. Fourier transformation and inverse Fourier transformation of the high-resolution TEM image revealed that the granular structure consists of half-Heusler domains with ordering and with disordering between second nearest neighbor atoms. (c) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：886 / 888
页数：3
相关论文
共 50 条
  • [1] Microstructures and Thermoelectric Properties of an Annealed Ti0.5(Hf0.5Zr0.5)0.5NiSn0.998Sb0.002 Ribbon
    Takao Morimura
    Masayuki Hasaka
    Syotaro Yoshida
    Hiromichi Nakashima
    Journal of Electronic Materials, 2009, 38 : 1154 - 1158
  • [2] Microstructures and Thermoelectric Properties of an Annealed Ti0.5(Hf0.5Zr0.5)0.5NiSn0.998Sb0.002 Ribbon
    Morimura, Takao
    Hasaka, Masayuki
    Yoshida, Syotaro
    Nakashima, Hiromichi
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (07) : 1154 - 1158
  • [3] Synthesis and thermoelectric properties of Ti-substituted (Hf0.5Zr0.5)1-xTixNiSn0.998Sb0.002 Half-Heusler compounds
    Nguyen Van Du
    Rahman, Jamil Ur
    Meang, Eun-Ji
    Lim, Chang-Hyun
    Shin, Weon Ho
    Seo, Won-Seon
    Pham Thanh Huy
    Kim, Myong Ho
    Lee, Soonil
    JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 773 : 1141 - 1145
  • [4] High-ZT half-Heusler thermoelectrics, Ti0.5Zr0.5NiSn and Ti0.5Zr0.5NiSn0.98Sb0.02: Physical properties at low temperatures
    Rogl, G.
    Yubuta, K.
    Romaka, V. V.
    Michor, H.
    Schafler, E.
    Grytsiv, A.
    Bauer, E.
    Rogl, P.
    ACTA MATERIALIA, 2019, 166 : 466 - 483
  • [5] Thermoelectric properties of the TiX(Zr0.5Hf0.5)1-XNiSn half-Heusler compounds
    Shutoh, N
    Sakurada, S
    JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 389 (1-2) : 204 - 208
  • [6] Thermoelectric properties of the Tix(Zr0.5Hf0.5)1-XNiSn half-Heusler compounds
    Shutoh, N
    Sakurada, S
    TWENTY-SECOND INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS ICT '03, 2003, : 312 - 315
  • [7] Hole localization in thermoelectric half-Heusler (Zr0.5Hf0.5)Co(Sb1-xSnx) thin films
    Heinz, Sven
    Balke, Benjamin
    Jakob, Gerhard
    THIN SOLID FILMS, 2019, 692
  • [8] Improved thermoelectric performance of p-doped half-Heusler Ti0.5Zr0.5CoSb0.5P0.5, Ti0.5Hf0.5CoSb0.5P0.5, and Zr0.5Hf0.5CoSb0.5P0.5 compounds
    Li, Congcong
    Li, Jia
    Mao, Xiujuan
    Liu, Ze
    Xu, Xiuting
    Liu, Yang
    Teng, Sukai
    Yin, Fuxing
    MATERIALS RESEARCH EXPRESS, 2019, 6 (12)
  • [9] Synthesis and thermoelectric properties of Ti0.5Hf0.5Co0.5Ir0.5Sb1-xSnx half-Heusler materials
    Callejas, Juan F.
    Takas, Nathan J.
    Poudeu, Pierre F. P.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2011, 241
  • [10] Thermoelectric Properties of Directionally Solidified Half-Heusler (M 0.5 a ,M 0.5 b )NiSn (Ma, Mb = Hf, Zr, Ti) Alloys
    Kimura, Yoshisato
    Ueno, Hazuki
    Mishima, Yoshinao
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (07) : 934 - 939
12345