Contrast transfer function measurement of X-ray solid state linear detectors using bar/space pattern methods

被引：5

作者：

Kaftandjian, V ^{[1
]}

Zhu, YM ^{[1
]}

Peix, G ^{[1
]}

Babot, D ^{[1
]}

机构：

[1] INST NATL SCI APPL,CREATIS,CNRS,URA 1216,F-69621 VILLEURBANNE,FRANCE

来源：

NDT & E INTERNATIONAL | 1996年 / 29卷 / 01期

关键词：

contrast transfer function; linear detector; X-ray;

D O I：

10.1016/0963-8695(95)00015-1

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This paper presents a detailed analysis of bar/space pattern methods used in the contrast transfer function (CTF) calculation of linear solid-state X-ray sensitive detectors (LD). The analysis presented centres on the effect of cell aperture on LD response as well as on the measurement of the LD's CTF along its main axis. Various theoretical simulations ave designed to obtain a better understanding of the behaviour of the LD. The simulation results are also compared with the experimental CTF measurements.

引用

页码：3 / 11

页数：9

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