Recognition and Classification of Hot Strip Surface Defect Based on Binary Tree SVM

被引：0

作者：

Wang, Anna ^{[1
]}

Hu, Chao ^{[1
]}

Xue, Changliang ^{[1
]}

Zhang, Hongrui ^{[1
]}

机构：

[1] Northeastern Univ, Coll Informat Sci & Engn, Shenyang 110819, Peoples R China

来源：

MATERIALS PROCESSING TECHNOLOGY II, PTS 1-4 | 2012年 / 538-541卷

关键词：

Hot strip surface defect; Classification; Super sphere; Binary tree SVM;

D O I：

10.4028/www.scientific.net/AMR.538-541.427

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The paper presents a new method which uses Binary Tree SVM in the automatic classification of surface defects for hot strip. Two types of Binary Tree SVMs are applied in defect classification. Compared with BP neural network and one-against-one SVM, the algorithm adopted in the paper greatly improved the accuracy of classification and decreased the classification time.

引用

页码：427 / 430

页数：4

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