Strip steel surface defect recognition based on Boosting optimized decision tree

被引：0
|
作者：
Yang, Shui-Shan [1 ]
He, Yong-Hui [1 ]
Zhao, Wan-Sheng [2 ]
机构：
[1] Shanghai Baosteel Research Institute, Shanghai 201900, China
[2] School of Mechanical Engineering, Shanghai Jiaotong University, Shanghai 200030, China
来源：
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2010年 / 39卷 / 05期
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学科分类号：
摘要：
10
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页码：954 / 958
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