Developments and improvements in the solution of the forward problem in capacitance and impedance tomography

被引：0
|
作者：
Spink, DM [1 ]
Noras, JM
机构：
[1] Univ Leeds, Dept Elect & Elect Engn, Leeds LS2 9JT, W Yorkshire, England
[2] Univ Bradford, Dept Elect & Elect Engn, Bradford BD7 1DP, W Yorkshire, England
来源：
TRANSACTIONS OF THE INSTITUTE OF MEASUREMENT AND CONTROL | 1998年 / 20卷 / 04期
关键词：
finite-element; tomography capacitance; impedance;
D O I：
10.1177/014233129802000404
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
An improved computationally efficient means of determining the capacitance matrix from the finite element representation of a capacitance tomography system is shown. This direct method is also applied to the analysis of impedance tomography for systems in which there exists either an insulating boundary or a conducting boundary. The paper discusses aspects of the direct solution method which can influence the solution time and accuracy, and the application of multi-frontal solution techniques, to enhance solution times on scalable parallel computing hardware.
引用
收藏
页码：186 / 194
页数：9
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