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Wavelet Shrinkage Estimation for Non-Homogeneous Poisson Process Based Software Reliability Models
被引:23
|作者:
Xiao, Xiao
[1
]
Dohi, Tadashi
[1
]
机构:
[1] Hiroshima Univ, Dept Informat Engn, Grad Sch Engn, Higashihiroshima 7398527, Japan
基金:
日本学术振兴会;
关键词:
Goodness-of-fit test;
nonhomogeneous Poisson process;
nonparametric estimation;
one-stage look-ahead prediction;
software reliability;
wavelet shrinkage estimation;
D O I:
10.1109/TR.2013.2240897
中图分类号:
TP3 [计算技术、计算机技术];
学科分类号:
0812 ;
摘要:
We develop a novel estimation approach for quantitative software reliability by means of wavelet-based technique, where the underlying software reliability model is described by a non-homogeneous Poisson process. Our approach involves some advantages over the commonly used techniques such as maximum likelihood estimation: 1) the wavelet shrinkage estimation enables us to carry out the time-series analysis with high speed and accuracy requirements; and 2) The wavelet shrinkage estimation is classified into a non-parametric estimation without specifying a parametric form of the software intensity function. We consider data-transform-based wavelet shrinkage estimation with four kinds of thresholding schemes for empirical wavelet coefficients to estimate the software intensity function. In numerical experiments with real software-fault count data, we show that our wavelet-based estimation methods can provide better goodness-of-fit performance than not only the conventional maximum likelihood estimation and least squares estimation but also the local likelihood estimation method, in many cases, in spite of their non-parametric nature. Furthermore, we investigate the predictive performance of the proposed methods by employing the so-called one-stage look-ahead prediction method, and estimate some predictive measures such as software reliability.
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页码:211 / 225
页数:15
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