Advances in X-ray microanalysis

被引：0
|
作者：
Friel, JJ
Greenhut, VA
机构：
[1] Princeton Gamma Tech, Princeton, NJ 08542 USA
[2] Rutgers State Univ, Piscataway, NJ 08854 USA
来源：
ADVANCED MATERIALS & PROCESSES | 1999年 / 156卷 / 01期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
X-ray microanalysis is a mature technique, and recent developments in the field have considerably extended its power. Sensitivity (count rate) has increased, dramatically speeding analysis and improving quantitative reliability.
引用
收藏
页码：28 / 32
页数：5
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