Advances in X-ray microanalysis

被引：0

作者：

Friel, JJ

Greenhut, VA

机构：

[1] Princeton Gamma Tech, Princeton, NJ 08542 USA

[2] Rutgers State Univ, Piscataway, NJ 08854 USA

来源：

ADVANCED MATERIALS & PROCESSES | 1999年 / 156卷 / 01期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray microanalysis is a mature technique, and recent developments in the field have considerably extended its power. Sensitivity (count rate) has increased, dramatically speeding analysis and improving quantitative reliability.

引用

页码：28 / 32

页数：5

共 50 条

[1] Advances in X-ray microanalysis
Princeton Gamma Tech, Princeton, United States
Adv Mater Processes, 1 (28-32):
[2] X-RAY OPTICS AND X-RAY MICROANALYSIS
AXON, HJ
JOURNAL OF THE INSTITUTE OF METALS, 1965, 93 : 607 - &
[3] X-RAY OPTICS + X-RAY MICROANALYSIS
HEINRICH, KF
AMERICAN SCIENTIST, 1965, 53 (03) : A382 - &
[4] X-RAY OPTICS AND X-RAY MICROANALYSIS
SANDS, DE
MICROCHEMICAL JOURNAL, 1965, 9 (01) : 100 - &
[5] X-RAY OPTICS AND X-RAY MICROANALYSIS
WERNER
METALL, 1966, 20 (05): : 550 - &
[6] X-RAY MICROSCOPY AND X-RAY MICROANALYSIS
COSSLETT, VE
NATURE, 1959, 184 (4690) : 860 - 862
[7] X-RAY MICROANALYSIS
BERGAMINI, P
ENERGIA NUCLEARE, 1976, 23 (06): : 323 - 331
[8] X-Ray Microanalysis
Bulloss, Nicholas A.
ADVANCED MATERIALS & PROCESSES, 2010, 168 (07): : 29 - 31
[9] X-ray microanalysis
Bulloss, Nicholas A.
Advanced Materials and Processes, 2010, 168 (07): : 29 - 31
[10] X-RAY MICROSCOPY AND MICROANALYSIS
不详
LANCET, 1961, 1 (717): : 701 - +

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