Optical properties study of PLZT films deposited on sapphire Substrate

被引：4

作者：

Khodorov, A. ^{[1
]}

Gomes, M. J. M. ^{[1
]}

机构：

[1] Univ Minho, Phys Ctr, P-4710057 Braga, Portugal

来源：

VACUUM | 2008年 / 82卷 / 12期

关键词：

PLZT; optical properties; sol-gel processes; structure properties;

D O I：

10.1016/j.vacuum.2008.03.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) Substrate by sol-gel method. The cell parameters of films were calculated with help of whole-pattern fitting procedure. The evolution of strain, shift of absorption edge and change in the band tailing with film thickness were found and analyzed for amorphous and polycrystalline PUT films. The refractive index n was computed with help of "Envelope method" and dielectric function was calculated by fitting the measured optical transmission spectrum. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：1495 / 1498

页数：4

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