Effects of contact interface degradation on the performance of CdZnTe detectors

被引：6

作者：

Qin, Kaifeng ^{[1
]}

Wang, Linjun ^{[1
]}

Min, Jiahua ^{[1
]}

Zhang, Jijun ^{[1
]}

Huang, Jian ^{[1
]}

Liang, Xiaoyan ^{[1
]}

Tang, Ke ^{[1
]}

Xia, Yiben ^{[1
]}

机构：

[1] Shanghai Univ, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China

来源：

VACUUM | 2012年 / 86卷 / 07期

关键词：

CdZnTe; Detectors; Metal-semiconductor contact; Scanning acoustic microscopy; Aging test;

D O I：

10.1016/j.vacuum.2011.07.048

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The characteristics of the Au contacts deposited by three different processes before and after accelerating aging tests have been investigated in this paper. The experimental results indicate that the aging tests can cause the degradation of the contact interfacial properties, such as continuities, adhesion strength and ohmic characteristics, especially for the contact electrode deposited by the thermal vacuum evaporation, which would influence the performance of CdZnTe detectors. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：943 / 945

页数：3

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