Scanning transmission x-ray spectromicroscopy of actinide complexes

被引:0
|
作者
Janousch, Markus [1 ]
Copping, Roy [1 ]
Tyliszczak, Tolek [1 ]
Castro-Rodriguez, Ingrid [1 ]
Shuh, David K. [1 ]
机构
[1] Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The fundamental characterization and understanding of 5f electron behavior in actinide complexes is imperative to provide an enhanced basis for the rational and accelerated development of improved processes relevant to nuclear energy. Soft x-ray absorption spectroscopy utilizing the scanning transmission x-ray microscope (STXM) at the Advanced Light Source-Molecular Environmental Science (ALS-MES) Beamline 11.0.2 has been used to probe the electronic characteristics of a nitrogen donor ligand 2,6-Bis(2-benzimidazyl)pyridine (BBP) and its resulting U(IV) complex. The nitrogen K- and carbon K-edges have been collected from both ligand and uranium complex, as well as the uranium 4d-edge from the complex. Upon complexation, the light element absorption spectra change markedly and the uranium spectra from the complex is compared to the reference spectrum obtained from U(IV)Cl-4. The evolution of the spectral features are described and interpreted within a simple conceptual framework. Based on spectral evidence alone, the uranium is bound through the pyridine-like nitrogens and the oxidation state of the uranium is consistent with a U(IV) species.
引用
收藏
页码:165 / 170
页数:6
相关论文
共 50 条
  • [21] Scanning soft X-ray spectromicroscopy at the Pohang Light Source: commissioning results
    Shin, HJ
    Lee, MK
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 : 909 - 912
  • [22] Microscopy and spectromicroscopy with soft X-ray
    Thieme, J.
    Gleber, S.
    Mitrea, G.
    Guttmann, P.
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2007, 15 (12): : 1878 - 1885
  • [23] The scanning transmission X-ray microscope at NSRL
    Jiang, S
    Chen, L
    Xu, CY
    Fu, SJ
    Chen, J
    Xu, Z
    JOURNAL DE PHYSIQUE IV, 2003, 104 : 81 - 84
  • [24] Soft X-ray spectromicroscopy and ptychography
    Hitchcock, Adam P.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2015, 200 : 49 - 63
  • [25] Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization
    Najafi, Ebrahim
    Wang, Jian
    Hitchcock, Adam P.
    Guan, Jingwen
    Denommee, Stephane
    Simard, Benoit
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2010, 132 (26) : 9020 - 9029
  • [26] A bidirectional scanning method for scanning transmission X-ray microscopy
    Sun, Tianxiao
    Zhang, Xiangzhi
    Xu, Zijian
    Wang, Yong
    Guo, Zhi
    Wang, Jian
    Tai, Renzhong
    JOURNAL OF SYNCHROTRON RADIATION, 2021, 28 : 512 - 517
  • [27] A bidirectional scanning method for scanning transmission X-ray microscopy
    Sun, Tianxiao
    Zhang, Xiangzhi
    Xu, Zijian
    Wang, Yong
    Guo, Zhi
    Wang, Jian
    Tai, Renzhong
    Journal of Synchrotron Radiation, 2021, 28 : 512 - 517
  • [28] Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source
    Warwick, T
    Ade, H
    Cerasari, S
    Denlinger, J
    Franck, K
    Garcia, A
    Hayakawa, S
    Hitchcock, A
    Kikuma, J
    Klingler, S
    Kortright, J
    Morisson, G
    Moronne, M
    Rightor, E
    Rotenberg, E
    Seal, S
    Shin, HJ
    Steele, WF
    Tonner, BP
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 1090 - 1092
  • [29] Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy
    U. Kleineberg
    G. Haindl
    A. Hütten
    G. Reiss
    E.M. Gullikson
    M.S. Jones
    S. Mrowka
    S.B. Rekawa
    J.H. Underwood
    Applied Physics A, 2001, 73 : 515 - 519
  • [30] Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy
    Kleineberg, U
    Haindl, G
    Hütten, A
    Reiss, G
    Gullikson, EM
    Jones, MS
    Mrowka, S
    Rekawa, SB
    Underwood, JH
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 73 (04): : 515 - 519