Panel: Mixed signal designs: Are there solutions today?

被引:0
|
作者
Sisk, N [1 ]
Rutenbar, RA [1 ]
机构
[1] INDIAN FOREST RES,WESTFIELD,NJ
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:304 / 304
页数:1
相关论文
共 50 条
  • [32] Challenges in CMOS mixed-signal designs for analog circuit designers
    Dowlatabadi, AB
    40TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2, 1998, : 47 - 50
  • [33] MIXED SIGNAL SOLUTIONS FOR HIGH RELIABILITY, MEDICAL APPLICATIONS
    Steer, Alison
    ELECTRONICS WORLD, 2012, 118 (1911): : 30 - 33
  • [34] Large-Signal Characterization of a Mixed-Signal SoC Receiver for Multiband SDR/CR Designs
    Ribeiro, Diogo C.
    Cruz, Pedro Miguel
    Carvalho, Nuno Borges
    2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2014, : 1424 - 1427
  • [35] Large-Signal Characterization of a Mixed-Signal SoC Receiver for Multiband SDR/CR Designs
    Ribeiro, Diogo C.
    Cruz, Pedro Miguel
    Carvalho, Nuno Borges
    2014 9TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE (EUMIC), 2014, : 480 - 483
  • [36] A Statistical Approach to Probe Chaos from Noise in Analog and Mixed Signal Designs
    Seghaier, Ibtissem
    Zaki, Mohamed H.
    Tahar, Sofiene
    2015 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, 2015, : 237 - 242
  • [37] AUTOMATED DESIGN TOOLS TARGET ANALOG AND MIXED-SIGNAL IC DESIGNS
    HARDING, B
    COMPUTER DESIGN, 1989, 28 (23): : 36 - 38
  • [38] Predicting Interferences of Switching High Voltage Devices on Mixed-Signal Designs
    Hirmer, Katrin
    Hofmann, Klaus
    2019 26TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS), 2019, : 354 - 357
  • [39] Design for testability strategies for mixed signal & analogue designs - from layout to system
    Richardson, Andrew
    Lechner, Andreas
    Olbrich, Thomas
    Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, 1998, 2 : 425 - 432
  • [40] Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog
    Nikolaos Georgoulopoulos
    Alkiviadis Hatzopoulos
    Journal of Electronic Testing, 2021, 37 : 685 - 700