Organic field effect transistors;
Grapheme oxide;
Hybrid organic semiconducting layer;
Nitrogen oxide;
Gas sensor;
FIELD-EFFECT TRANSISTORS;
STABILITY;
D O I:
10.1117/12.2506448
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Bottom-gated, top-contact organic field effect transistors (OFET) based nitrogen oxide (NO2) gas sensors were fabricated by incorporating a hybrid organic semiconducting (OSC) layer, which consisting of 6, 13-bis(triisopropyl-silylethynyl) pentacene (TIPS-pentacene) and Graphene Oxide (GO). By carefully optimizing the proportion of GO in the OSC layer, a tremendous improvement of sensing performance was obtained when exposed to NO2 analyte. Compared with OFET devices based on pure TIPS-pentacene OSC layer, the sensitivity of OFET sensors with hybrid OSC layer had a tenfold enhancement. By analyzing the semiconducting layer through utilizing X-ray diffraction (XPS) and atomic force microscope (AFM), the enhanced sensing performance was attributed to the absorption of the NO2 gas molecules through a porous OSC layer and a preferable interaction between functional groups on the edge of GO sheets and NO2 gas molecules. The improved sensing performance by the hybrid OSC layer also suggests the possibility of GO for the further application in high performance OFET based gas sensors.
机构:
Hongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South KoreaHongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South Korea
Park, J
Kang, SI
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Hongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South KoreaHongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South Korea
Kang, SI
Jang, SP
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Hongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South KoreaHongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South Korea
Jang, SP
Choi, JS
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Hongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South KoreaHongik Univ, Dept Elect Informat & Control Engn, Seoul 121791, South Korea
Choi, JS
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
2005,
44
(1B):
: 648
-
651
机构:
Univ Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA
He, Zhengran
Chen, Jihua
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机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAUniv Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA
Chen, Jihua
Keum, Jong Kahk
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机构:
Oak Ridge Natl Lab, Neutron Scattering Sci Div, Oak Ridge, TN 37831 USAUniv Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA
Keum, Jong Kahk
Szulczewski, Greg
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机构:
Univ Alabama, Dept Chem, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA
Szulczewski, Greg
Li, Dawen
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机构:
Univ Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USAUniv Alabama, Ctr Mat Informat Technol, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA