Investigation of Uncertain Factors on Measuring Residual Stress with Critically Refracted Longitudinal Waves

被引:14
|
作者
Yang, Shunmin [1 ]
Wang, Mingquan [1 ]
Yang, Lu [1 ]
机构
[1] North Univ China, Sci & Technol Elect Test & Measurement Lab, Taiyuan 030051, Shanxi, Peoples R China
来源
APPLIED SCIENCES-BASEL | 2019年 / 9卷 / 03期
基金
对外科技合作项目(国际科技项目);
关键词
critically refracted longitudinal wave; residual stress; uncertain factors; X-ray diffraction; X-RAY-DIFFRACTION; PLATES;
D O I
10.3390/app9030485
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Critically refracted longitudinal (L-CR) waves are commonly used to evaluate the residual stress of a material. The utilization of L-CR waves is advantageous in that these waves are not sensitive to the texture of the material. Thus, L-CR can be considered as a bulk longitudinal mode and can penetrate into the material well below its surface. However, while measuring the residual stress, the precision of the L-CR wave travel-time is influenced by several uncertain factors. In order to further improve the accuracy of test results, we developed a measurement approach based on three aspects. First, the distances between the transmitter and the receivers were determined by transducer signal analysis. Second, for the residual stress detection to be consistent, transducers with different frequencies presented similar beam divergence angles. Finally, three different frequencies were used to evaluate the residual stress throughout the plate thickness. Based on the results of the above analysis, we used L-CR waves to test 304 stainless steel plates. The detection error of residual stress measurement was ca. +/- 23 MPa. When compared with the X-ray diffraction approach, our method showed similar trends for the same regions of the specimens.
引用
收藏
页数:12
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