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- [23] Novel Methods for SPC defect monitoring: Normalizable Diversity Sampling 2016 27TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2016, : 83 - 86
- [26] Research on Process Monitoring Method Based on SPC and PCA Technology 2011 CHINESE CONTROL AND DECISION CONFERENCE, VOLS 1-6, 2011, : 691 - 694
- [27] Online machining process monitoring using wavelet transform and SPC 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5, 2006, : 2081 - +