Highly charged ion impact on graphene leading to the emission of low energy electrons

被引:0
|
作者
Schwestka, J. [1 ]
Niggas, A. [1 ]
Creutzburg, S. [2 ]
Kozubek, R. [3 ,4 ]
Madau, L. [3 ,4 ]
Heller, R. [2 ]
Schleberger, M. [3 ,4 ]
Facsko, S. [2 ]
Wilhelm, R. A. [1 ,2 ]
Aumayr, F. [1 ]
机构
[1] TU Wien, Inst Appl Phys, A-1040 Vienna, Austria
[2] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, D-01328 Dresden, Germany
[3] Univ Duisburg Essen, Fac Phys, D-47057 Duisburg, Germany
[4] CENIDE, D-47057 Duisburg, Germany
关键词
D O I
10.1088/1742-6596/1412/20/202012
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Recent experiments found that the neutralisation of highly charged ions interacting with a freestanding single layer of graphene proceeds on a femtosecond time scale. This ultra-fast deexcitation was attributed to Interatomic Coulombic Decay (ICD), a process in which core holes in the projectile are filled by previously captured outer electrons and the energy is transferred to electrons of the surrounding carbon atoms. ICD therefore predicts the emission of many low energy electrons. We now present experimental evidence that e.g. Xe40+ indeed emits up to 85 electrons with energies below 20 eV.
引用
收藏
页数:1
相关论文
共 50 条
  • [31] Highly charged ion based time-of-flight emission microscope
    Hamza, AV
    Barnes, AV
    Magee, E
    Newman, M
    Schenkel, T
    McDonald, JW
    Schneider, DH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (05): : 2077 - 2081
  • [32] Cluster ion emission in the interaction of slow highly charged ions with surfaces
    T. Schenkel
    A.V. Barnes
    A.V. Hamza
    D.H. Schneider
    The European Physical Journal D - Atomic, Molecular, Optical and Plasma Physics, 1998, 1 : 297 - 302
  • [33] Differential electron emission from multi-electronic targets under highly charged bare ion impact
    Biswas, Shubhadeep
    Misra, D.
    Monti, J. M.
    Tachino, C. A.
    Rivarola, R. D.
    Tribedi, L. C.
    XXIX INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC, AND ATOMIC COLLISIONS (ICPEAC2015), PTS 1-12, 2015, 635
  • [34] Particle emission from two-dimensional MoS2 induced by highly charged ion impact
    Skopinski, L.
    Ernst, P.
    Herder, M.
    Schleberger, M.
    31ST INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC XXXI), 2020, 1412
  • [35] INJECTION AND STORAGE OF SINGLY CHARGED IONS AND EXTENSION OF THE PRINCIPLES OF ION STORAGE TO HIGHLY CHARGED LOW-ENERGY RECOIL IONS
    SCHUESSLER, HA
    O, CS
    LAKKARAJU, HS
    PHYSICA SCRIPTA, 1983, T3 : 27 - 34
  • [36] Highly charged ion energy gain spectroscopy of molecular excitations
    Lucas, A. A.
    Benedek, G.
    Sunjic, M.
    Echenique, P. M.
    CHEMICAL PHYSICS LETTERS, 2010, 493 (1-3) : 49 - 52
  • [37] Dissociative ionization of OCS induced by highly charged ion impact
    Wang, Bo
    Han, Jie
    Zhu, Xiaolong
    Wei, Long
    Ren, Baihui
    Zhang, Yu
    Yu, Wandong
    Yan, Shuncheng
    Ma, Xinwen
    Zou, Yaming
    Chen, Li
    Wei, Baoren
    PHYSICAL REVIEW A, 2021, 103 (04)
  • [38] Protein fragmentation due to slow highly charged ion impact
    Lawrence Livermore Natl Lab, Livermore, United States
    Nanotechnology, 3 (251-256):
  • [39] Double ionization of helium by relativistic highly charged ion impact
    Voitkiv, AB
    Najjari, B
    Ullrich, J
    JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS, 2005, 100 (03) : 516 - 520
  • [40] Nanofabrication on a Si surface by slow highly charged ion impact
    Tona, Masahide
    Watanabe, Hirofumi
    Takahashi, Satoshi
    Nakamura, Nobuyuki
    Yoshiyasu, Nobuo
    Sakurai, Makoto
    Terui, Toshifumi
    Mashiko, Shinro
    Yamada, Chikashi
    Ohtani, Shunsuke
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 256 (01): : 543 - 546