Continuous wave terahertz phase imaging with three-step phase-shifting

被引:15
|
作者
Sun, Wenfeng [1 ,2 ]
Wang, Xinke [1 ,2 ]
Zhang, Yan [1 ,2 ]
机构
[1] Capital Normal Univ, Dept Phys, Beijing 100048, Peoples R China
[2] Minist Educ, Beijing Key Lab Terahertz Spect & Imaging, Key Lab Terahertz Optoelect, Beijing 100048, Peoples R China
来源
OPTIK | 2013年 / 124卷 / 22期
基金
中国国家自然科学基金;
关键词
Terahertz; Continues wave; Interferogram; Phase imaging; INTERFEROMETRY;
D O I
10.1016/j.ijleo.2013.03.150
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrated a continuous wave terahertz (THz) phase imaging system which can present the depth information of an object's surface interior accurately and non-invasively. With the three-step phase-shifting method, the phase images of samples which can provide the relative optical depth profile of the sample's surface and interior have been achieved. Two samples with different thickness and materials were measured to demonstrate the phase imaging ability of the system. The results show that this method is effective and the measured values agree well with the actual ones. The longitudinal resolution of the system was also measured. To exhibit the advantages of the three-step phase shifting method, the multi-wavelength imaging method was also employed and the results are compared. (C) 2013 Published by Elsevier GmbH.
引用
收藏
页码:5533 / 5536
页数:4
相关论文
共 50 条
  • [1] Fast three-step phase-shifting algorithm
    Huang, Peisen S.
    Zhang, Song
    [J]. APPLIED OPTICS, 2006, 45 (21) : 5086 - 5091
  • [2] Double three-step phase-shifting algorithm
    Huang, PS
    Hu, QYJ
    Chiang, FP
    [J]. APPLIED OPTICS, 2002, 41 (22) : 4503 - 4509
  • [3] Parallel three-step phase-shifting digital holography
    Awatsuji, Y
    Fujii, A
    Kubota, T
    Matoba, O
    [J]. APPLIED OPTICS, 2006, 45 (13) : 2995 - 3002
  • [4] Numerical three-step phase-shifting microwave holography
    Kumari, Vineeta
    Barak, Neelam
    Sheoran, Gyanendra
    [J]. OPTICAL ENGINEERING, 2019, 58 (11)
  • [5] Three-step phase-shifting imaging ellipsometry to measure nanofilm thickness profiles
    Shoji, Eita
    Komiya, Atsuki
    Okajima, Junnosuke
    Kubo, Masaki
    Tsukada, Takao
    [J]. OPTICS AND LASERS IN ENGINEERING, 2019, 112 : 145 - 150
  • [6] Motion-compensated three-step phase-shifting profilometry
    Feng, Shijie
    Zuo, Chao
    Tao, Tianyang
    Hu, Yan
    Chen, Qian
    Gu, Guohua
    [J]. SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018), 2018, 10827
  • [7] Three-step self-calibrating generalized phase-shifting interferometry
    张宇
    [J]. Chinese Physics B, 2022, (03) : 274 - 280
  • [9] Object wave retrieval using normalized holograms in three-step generalized phase-shifting digital holography
    Yoshikawa, Nobukazu
    Namiki, Syouma
    Uoya, Atsushi
    [J]. APPLIED OPTICS, 2019, 58 (05) : A161 - A168
  • [10] Optimized three-step phase-shifting profilometry using the third harmonic injection
    Zuo, Chao
    Chen, Qian
    Gu, Guohua
    Ren, Jianle
    Sui, Xiubao
    Zhang, Yuzhen
    [J]. OPTICA APPLICATA, 2013, 43 (02) : 393 - 408