共 50 条
- [41] Analysis of porous silicon structures using FTIR and Raman spectroscopy JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS, 2023, 74 (03): : 218 - 227
- [42] Chemical beveling of Si/SiGe structures for structure and material analysis by Raman Spectroscopy ASDAM '02, CONFERENCE PROCEEDINGS, 2002, : 195 - 198
- [43] CHEMICAL PROCESS DIAGNOSTICS USING REMOTE RAMAN-SPECTROSCOPY ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 155 - ANYL