Infrared spectroscopic ellipsometry for the characterization of hybrid bilayer membranes

被引：0
|
作者：
Meuse, CW [1 ]
机构：
[1] Natl Inst Stand & Technol, Div Biotechnol, Gaithersburg, MD 20899 USA
来源：
BIOPHYSICAL JOURNAL | 1999年 / 76卷 / 01期
关键词：
D O I：
暂无
中图分类号：
Q6 [生物物理学];
学科分类号：
071011 ;
摘要：
引用
收藏
页码：A55 / A55
页数：1
相关论文
共 50 条
  • [41] Simultaneous characterization of physical, chemical, and thermal properties of polymeric multilayers using infrared spectroscopic ellipsometry
    Castilla-Casadiego, David A.
    Pinzon-Herrera, Luis
    Perez-Perez, Maritza
    Quinones-Colon, Beatriz A.
    Suleiman, David
    Almodovar, Jorge
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 2018, 553 : 155 - 168
  • [42] INFRARED SPECTROSCOPIC ELLIPSOMETRY USING A FOURIER-TRANSFORM INFRARED SPECTROMETER - SOME APPLICATIONS IN THIN-FILM CHARACTERIZATION
    FERRIEU, F
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (10): : 3212 - 3216
  • [43] Characterization of deposited nanocrystalline silicon by spectroscopic ellipsometry
    Bertin, F
    Baron, T
    Mariolle, D
    Martin, F
    Chabli, A
    Dupuy, M
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1999, 175 (01): : 405 - 412
  • [44] Optical characterization of nanoporous GaN by spectroscopic ellipsometry
    Lee, Jeong-Hae
    Lee, Baro
    Kang, Jin-Ho
    Lee, June Key
    Ryu, Sang-Wan
    THIN SOLID FILMS, 2012, 525 : 84 - 87
  • [45] Spectroscopic ellipsometry characterization of multilayer optical coatings
    Hilfiker, James N.
    Pribil, Greg K.
    Synowicki, Ron
    Martin, Andrew C.
    Hale, Jeffrey S.
    SURFACE & COATINGS TECHNOLOGY, 2019, 357 : 114 - 121
  • [46] IR spectroscopic ellipsometry for industrial characterization of semiconductors
    Boher, P
    Bucchia, M
    Piel, JP
    Defranoux, C
    Stehle, JL
    Pickering, C
    OPTICAL METROLOGY ROADMAP FOR THE SEMICONDUCTOR, OPTICAL, AND DATA STORAGE INDUSTRIES II, 2001, 4449 : 69 - 78
  • [47] Characterization of PECVD SiN films by spectroscopic ellipsometry
    Brierley, SK
    Nguyen, L
    AMORPHOUS AND CRYSTALLINE INSULATING THIN FILMS - 1996, 1997, 446 : 145 - 150
  • [48] SPECTROSCOPIC ELLIPSOMETRY FOR THE CHARACTERIZATION OF THIN-FILMS
    FERRIEU, F
    LECAT, JH
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (07) : 2203 - 2208
  • [49] Spectroscopic ellipsometry for characterization and monitoring of organic layers
    Arwin, H
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2001, 188 (04): : 1331 - 1338
  • [50] Hybrid bilayer membranes: Fabrication and characterization of biomimetic surfaces for biosensor applications.
    Elliott, JT
    Meuse, CW
    Vanderah, DJ
    Silin, V
    Plant, AL
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U257 - U257
12345