Surface analysis: X ray photoelectron spectroscopy and Auger electron spectroscopy

被引：0

作者：

Turner, NH ^{[1
]}

Schreifels, JA ^{[1
]}

机构：

[1] GEORGE MASON UNIV, DEPT CHEM, FAIRFAX, VA 22030 USA

来源：

ANALYTICAL CHEMISTRY | 1996年 / 68卷 / 12期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

565

引用

页码：R309 / R331

页数：23

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