In situ functionalized self-assembled monolayer surfaces for selective chemical vapor deposition of copper

被引:6
|
作者
Liu, Xin [1 ]
Wang, Qi [2 ]
Chen, Liu-Ping [1 ]
机构
[1] Sun Yat Sen Univ, Sch Chem & Chem Engn, Guangzhou 510275, Guangdong, Peoples R China
[2] Zhejiang Univ, Dept Chem, Hangzhou 310027, Peoples R China
基金
中国国家自然科学基金;
关键词
Copper thin film; Selective chemical vapor deposition; Self-assembled monolayer; In situ functionalization; RAY PHOTOELECTRON-SPECTROSCOPY; LARGE-SCALE INTEGRATION; DIFFUSION-BARRIERS; MOLECULAR ELECTRONICS; FILMS; OXIDATION; THIOLS; CVD;
D O I
10.1016/j.apsusc.2008.10.051
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Recent studies show that the self-assembled monolayer (SAM) is well suited to control the selectivity of chemical vapor deposition (CVD). Here, we reported the selective CVD for copper on the functionalized SAM surfaces (with -SH, -SS-, and -SO3H terminal groups). The -SS- and -SO3H terminal group surfaces were obtained through in situ chemical transformation of -SH terminal group surface of a 3-mercaptopropyltrimethoxysilane- SAM (MPTMS-SAM). As a result, the -SS- terminal group surface reduces copper deposition and the -SO3H terminal group surface enhances copper deposition comparing to the -SH terminal group surface. In addition, the MPTMS-SAM was irradiated by UV-light through a photo mask to prepare SH-group and OH-group regions. Then, copper films were deposited only on the SH-group region of the substrate in chemical vapor deposition. Finally, patterns of copper films were formed in the way of UV-light irradiation. These results are expected for use of selective deposition of copper metallization patterns in IC manufacturing processe s. (c) 2008 Elsevier B. V. All rights reserved.
引用
收藏
页码:3789 / 3794
页数:6
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