Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffraction

被引:20
|
作者
Hurley, PJ
Humphreys, FJ
机构
[1] UMIST, Manchester Mat Sci Ctr, Manchester M1 7HS, Lancs, England
[2] Univ Manchester, Manchester M1 7HS, Lancs, England
来源
JOURNAL OF MICROSCOPY-OXFORD | 2002年 / 205卷
关键词
absolute grain reconstruction; angular resolution; deformation; FEGSEM; linear intercept; microshear bands; relative Euler contrast; substructure; TEM;
D O I
10.1046/j.1365-2818.2002.00997.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The application of high resolution electron backscatter diffraction (EBSD) in a field emission gun scanning electron microscope to the characterization of a deformed aluminium. alloy is discussed and the results are compared with those obtained by transmission electron microscopy. It is shown that the adequate spatial resolution, accompanied by the improvement in angular resolution to similar to0.5degrees that can be achieved by data processing, together with the extensive quantitative data obtainable, make EBSD a suitable method for characterizing the cell or subgrain structures in deformed aluminium. The various methods of analysing EBSD data to obtain subgrain sizes are discussed and it is concluded that absolute subgrain reconstruction is the most accurate.
引用
收藏
页码:218 / 225
页数:8
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