Design and Analysis of the Millimeter-Wave SPDT Switch for TDD Applications

被引:42
|
作者
Byeon, Chul Woo [1 ]
Park, Chul Soon [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea
基金
新加坡国家研究基金会;
关键词
CMOS; millimeter wave; single-pole double-throw (SPDT) switch; 60; GHz; true time delay (TDD); GHZ;
D O I
10.1109/TMTT.2013.2271613
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a low-loss and high Tx-to-Rx isolation single-pole double-throw (SPDT) millimeter-wave switch for true time delay applications. The switch is designed based on matching-network and double-shunt transistors with quarter-wavelength transmission lines. The insertion loss and isolation characteristics of the switches are analyzed revealing that optimization of the transistor size with a matching-network switch on the receiver side and a double-shunt switch on the transmitter side can enhance the isolation performance with low loss. Implemented in 90-nm CMOS, the switch achieves a measured insertion loss and Tx-to-Rx isolation of 1.9 and 39 dB at 60 GHz, respectively. The input 1-dB gain compression point is 10 dBm at 60 GHz, and the return loss of the SPDT switch ports is greater than 10 dB at 48-67 GHz.
引用
收藏
页码:2858 / 2864
页数:7
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