Soft X-ray transmission polarizer based on ferromagnetic thin films

被引：4

作者：

Mueller, L. ^{[1
,2
]}

Hartmann, G. ^{[3
]}

Schleitzer, S. ^{[1
]}

Berntsen, M. H. ^{[4
]}

Walther, M. ^{[1
]}

Rysov, R. ^{[1
]}

Roseker, W. ^{[1
]}

Scholz, F. ^{[3
]}

Seltmann, J. ^{[3
]}

Glaser, L. ^{[3
]}

Viefhaus, J. ^{[3
]}

Mertens, K. ^{[2
]}

Bagschik, K. ^{[5
,6
]}

Froemter, R. ^{[5
]}

De Fanis, A. ^{[7
]}

Sheychuk, I. ^{[7
]}

Medjanik, K. ^{[8
]}

Ohrwall, G. ^{[8
]}

Oepen, H. P. ^{[5
,6
]}

Martins, M. ^{[2
]}

Meyer, M. ^{[7
]}

Gruebel, G. ^{[1
,6
]}

机构：

[1] Deutsch Elektronen Synchrotron DESY, FS CXS, D-22607 Hamburg, Germany

[2] Univ Hamburg, Dept Phys, D-22761 Hamburg, Germany

[3] Deutsch Elektronen Synchrotron DESY, FS PE, D-22607 Hamburg, Germany

[4] KTH Royal Inst Technol, SCI Mat Phys, Electrum 229, S-16440 Kista, Sweden

[5] Univ Hamburg, Ctr Hybrid Nanostruct, D-22761 Hamburg, Germany

[6] Hamburg Ctr Ultrafast Imaging CUI, D-22761 Hamburg, Germany

[7] European XFEL, D-22869 Schenefeld, Germany

[8] Lund Univ, MAX Lab 4, S-22100 Lund, Sweden

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2018年 / 89卷 / 03期

关键词：

MAGNETIC-ANISOTROPY;

D O I：

10.1063/1.5018396

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A transmission polarizer for producing elliptically polarized soft X-ray radiation from linearly polarized light is presented. The setup is intended for use at synchrotron and free-electron laser beamlines that do not directly offer circularly polarized light for, e.g., X-ray magnetic circular dichroism (XMCD) measurements or holographic imaging. Here, we investigate the degree of ellipticity upon transmission of linearly polarized radiation through a cobalt thin film. The experiment was performed at a photon energy resonant to the Co L-3-edge, i.e., 778 eV, and the polarization of the transmitted radiation was determined using a polarization analyzer that measures the directional dependence of photo electrons emitted from a gas target. Elliptically polarized radiation can be created at any absorption edge showing the XMCD effect by using the respective magnetic element. Published by AIP Publishing.

引用

页数：3

共 50 条

[41] Characterization of TiO2 thin films in the EUV and soft X-ray region
Comisso, A.
Giglia, A.
Nardello, M.
Tessarolo, E.
Calvillo, L.
Sertsu, M. G.
Granozzi, G.
Gerlin, F.
Brigo, L.
Nicolosi, P.
EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE IV, 2015, 9510
[42] Estimation of the density and roughness of thin monolayer films by soft X-ray reflectivity measurements
Kikuchi, Yukiko, 1600, (29):
[43] Soft x-ray resonant reflectivity of low-Z material thin films
Wang, C
Araki, T
Ade, H
APPLIED PHYSICS LETTERS, 2005, 87 (21) : 1 - 3
[44] Preparation and characterization of fluorocarbon thin films deposited by soft X-ray ablation of polytetrafluoroethylene
Kanashima, T
Maida, O
Kohma, N
Okumoto, M
Ueno, M
Kitai, S
Okuyama, M
Ohashi, H
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (6A): : L603 - L606
[45] Influence of structural disorder on soft x-ray optical behavior of NbC thin films
Singh, Amol
Modi, Mohammed H.
Rajput, Parasmani
Sinha, A. K.
Lodha, G. S.
JOURNAL OF APPLIED PHYSICS, 2015, 117 (17)
[46] In situ and ex situ characterization of thin films by soft X-ray emission spectroscopy
Guo, JH
Skytt, P
Wassdahl, N
Nordgren, J
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2000, 110 (1-3) : 41 - 67
[47] X-ray and AFM studies of ultrathin films for EUV and soft X-ray applications
Asadchikov, VE
Duparré, A
Kozhevnikov, IV
Krivonosov, YS
Sagitov, SI
ADVANCES IN OPTICAL INTERFERENCE COATINGS, 1999, 3738 : 387 - 393
[48] Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region
Sandberg, RL
Allred, DD
Lunt, S
Urry, MK
Turley, RS
OPTICAL CONSTANTS OF MATERIALS FOR UV TO X-RAY WAVELENGTHS, 2004, 5538 : 107 - 118
[49] Geomicrobiology with soft X-ray scanning transmission microscopy
Hitchcock, Adam P.
Dynes, James J.
Obst, Martin
Lawrence, John R.
Leppard, Gary G.
GEOCHIMICA ET COSMOCHIMICA ACTA, 2008, 72 (12) : A381 - A381
[50] Simultaneous soft X-ray transmission and emission microscopy
Gianoncelli, A.
Kaulich, B.
Alberti, R.
Klatka, T.
Longoni, A.
de Marco, A.
Marcello, A.
Kiskinova, M.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 608 (01): : 195 - 198

← 1 2 3 4 5 →