Bottom-contact small-molecule n-type organic field effect transistors achieved via simultaneous modification of electrode and dielectric surfaces

被引:17
|
作者
Cernetic, Nathan [1 ]
Acton, Orb [1 ]
Weidner, Tobias [2 ]
Hutchins, Daniel O. [1 ]
Baio, Joe E. [2 ]
Ma, Hong [1 ]
Jen, Alex K. -Y. [1 ,3 ]
机构
[1] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA
[2] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
[3] Univ Washington, Dept Chem, Seattle, WA 98195 USA
基金
美国国家科学基金会; 新加坡国家研究基金会;
关键词
Organic field effect transistor (OFET); Self-assembled monolayer; Simultaneous modification; Contact resistance; Bottom-contact; Small molecule organic semiconductor; THIN-FILM TRANSISTORS; SELF-ASSEMBLED MONOLAYERS; ABSORPTION FINE-STRUCTURE; ACTIVE-MATRIX DISPLAYS; LOW-VOLTAGE; CHARGE INJECTION; PERFORMANCE; SEMICONDUCTORS; BENZENE; SPECTRA;
D O I
10.1016/j.orgel.2012.09.018
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low-voltage, n-type organic field effect transistors (OFETs) with simultaneously modified bottom-contact (BC) electrodes and dielectric were compared to their top-contact (TC) counterparts. The devices modified with 6-phenoxyhexylphosphonic acid (Ph6PA) self-assembled monolayer (SAM) showed similar performance, morphology, and contact resistance. Electron mobility of C-60 devices were 0.212 and 0.320 cm(2) V-1 s(-1) and [6,6]-phenyl-C-61-butyric acid methyl ester (PCBM) devices were 0.04 and 0.06 cm(2) V-1 s(-1) for TC and BC devices, respectively. Low contact resistance between 11 and 45 k Omega cm was found regardless of device architecture or n-type semiconductor used. This work shows it is possible to fabricate solution processable low-voltage bottom-contact devices with performance that is similar or better than their top-contact counterparts without the addition of complex and time-consuming processing steps. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:3226 / 3233
页数:8
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