Power Constraint Testing for Multi-Clock Domain SoCs Using Concurrent Hybrid BIST

This paper presents a novel approach for selecting optimal pseudo random and deterministic test patterns and minimizing test time for multi-clock domain SoCs based on a hybrid BIST architecture for each core. For test scheduling, a concurrent method considering peak power upper bound is used. A test scheduling graph is presented for modeling concurrent hybrid BIST test scheduling. Furthermore, a heuristic is proposed for selecting cores to be tested concurrently and the order of applying sequence of test patterns to each core. Experimental results show that the proposed heuristics for both selecting groups of cores to be tested concurrently during the SoC test process, and determining the amount of deterministic and pseudo random test patterns for each core, give us an optimized method for multi clock domain SoC testing compared with the existing methods.