Practical Applications of Mixture Models to Complex Time-to-Failure Data

被引:0
|
作者
Zhao, Ke [1 ]
Steffey, Duane [1 ]
机构
[1] Exponent Inc, Stat & Data Sci, Menlo Pk, CA 94025 USA
来源
59TH ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS) | 2013年
关键词
product mixture model; warranty claims; sales volume; time-to-failure distribution; Weibull;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Statistical time-to-failure analysis is a very powerful and versatile analytical tool available to reliability engineers and statisticians for understanding and communicating the failure risk and reliability of a component, device, or system. The typical approach to characterizing time to failure involves fitting a parametric distribution, such as a Weibull probability function, using historical data on sales and records of failure incidents since the launch of a product. However, such modeling assumes that each deployed unit has an equal chance of failing by any specified age. Such assumptions are often violated when two or more subpopulations exist but cannot be identified and analyzed separately. For example, production process changes, defects generated during component manufacturing, errors in the assembly process, variation of consumer behavior, and variation of operating environmental conditions can all result in significant heterogeneity in performance best described by multiple time-to-failure distributions. Available information does not always exist to separate such subpopulations. Neglecting to account for differences in time-to-failure distributions can lead to erroneous interpretations and predictions. Weibull mixture models can characterize such complex reliability data in situations when segregating subpopulations is impractical. This paper presents three case studies that successfully applied mixture modeling to field reliability data that could not be adequately modeled by standard time-to-failure distributions for homogeneous product populations.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Comparison of time-to-failure of GeSi and Si bipolar transistors
    Univ of Florida, Gainesville, United States
    IEEE Electron Device Lett, 5 (211-213):
  • [32] Investigating Complex Isochron Data Using Mixture Models
    Davies, Joshua H. F. L.
    Sheldrake, Tom E.
    Reimink, Jesse R.
    Wotzlaw, Jorn-Frederik
    Moeck, Christian
    Finlay, Alex
    GEOCHEMISTRY GEOPHYSICS GEOSYSTEMS, 2018, 19 (10): : 4035 - 4047
  • [33] A comparison of degradation and failure-time analysis methods for estimating a time-to-failure distribution
    Lu, CJ
    Meeker, WQ
    Escobar, LA
    STATISTICA SINICA, 1996, 6 (03) : 531 - 546
  • [34] Data-Driven Insights on Time-to-Failure of Electromechanical Manufacturing Devices: A Procedure and Case Study
    Castano, Fernando
    Cruz, Yarens J.
    Villalonga, Alberto
    Haber, Rodolfo E.
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2023, 19 (05) : 7190 - 7200
  • [35] SPREAD OF TIME-TO-FAILURE MEASUREMENTS IN THIN METALLIC FILMS
    BOBBIO, A
    SARACCO, O
    THIN SOLID FILMS, 1973, 17 (01) : S13 - S16
  • [36] REGRESSION MODELS FOR FAILURE TIME DATA
    PRENTICE, RL
    BIOMETRICS, 1975, 31 (02) : 599 - 599
  • [37] FAILURE TIME MODELS WITH MATCHED DATA
    WILD, CJ
    BIOMETRIKA, 1983, 70 (03) : 633 - 641
  • [38] BIOFILM COMPUTER-MODELS - TIME FOR PRACTICAL APPLICATIONS
    DIGIANO, FA
    SPEITEL, GE
    JOURNAL AMERICAN WATER WORKS ASSOCIATION, 1993, 85 (05): : 26 - 26
  • [39] Reliability models for a nonrepairable system with heterogeneous components having a phase-type time-to-failure distribution
    Kim, Heungseob
    Kim, Pansoo
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2017, 159 : 37 - 46
  • [40] A study of bimodal distributions of time-to-failure of copper via electromigration
    Lai, JB
    Yang, JL
    Wang, YP
    Chang, SH
    Hwang, RL
    Huang, YS
    Hou, CS
    2001 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS, PROCEEDINGS OF TECHNICAL PAPERS, 2001, : 271 - 274