Temperature noise constants extraction of mm-wave FETs from measured S- and noise parameters

被引：0
|
作者：
Abdipour, A [1 ]
Pacaud, A [1 ]
机构：
[1] SUPELEC,DEPT RADIOELECT & ELECT,F-91192 GIF SUR YVETTE,FRANCE
来源：
1996 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：1723 / 1726
页数：4
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