Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniques

被引：1
|
作者：
Cheung, JY
Stewart, RJ [1 ]
May, RP
机构：
[1] Univ Reading, JJ Thomson Phys Lab, Reading RG6 6AF, Berks, England
[2] Inst Max Von Laue Paul Langevin, Large Scale Struct Grp, F-38042 Grenoble 9, France
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2006年 / 39卷
关键词：
D O I：
10.1107/S0021889805033698
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The time-of-flight technique is used on a small-angle neutron scattering instrument to separate the energies of the scattered neutrons, in order to determine the origin of the temperature-dependent scattering observed from silicon at Q > similar to 0.1 angstrom(-1). A quantitative analysis of the results in comparison with the phonon dispersion curves, determined by Dolling using a triple-axis neutron spectrometer, shows that the temperature-dependent scattering can be understood in terms of Umklapp processes whereby neutrons gain energy from phonons.
引用
收藏
页码：46 / 52
页数：7
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