Copper filling of deep sub-μm through-holes by high-vacuum planar magnetron sputtering using argon gas with added nitrogen:: Optimum quantity of nitrogen in argon gas

被引:4
|
作者
Saito, S [1 ]
Uhara, Y [1 ]
Uenosono, T [1 ]
Nagata, J [1 ]
Oyama, M [1 ]
Nozue, M [1 ]
Miura, T [1 ]
Soumura, T [1 ]
Kioka, T [1 ]
机构
[1] Tokyo Univ Sci, Fac Engn, Dept Elect Engn, Shinjuku Ku, Tokyo 1628605, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 2A期
关键词
high-vacuum sputtering; Cu filling; sub-mu m through-hole; amount of added nitrogen; Cu interconnection; conformal filling;
D O I
10.1143/JJAP.45.736
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the effectiveness of using argon gas with added nitrogen when filling deep sub-mu m through-holes with copper by high-vacuum planar magnetron sputtering, and we examined the optimum amount of added nitrogen. This is done by varying the amount of added nitrogen between 0.5, 1.0, 3.0, 10, and 20 at.% in copper filling experiments conducted at a substrate temperature of 280 degrees C and a gas pressure of p = 9.0 x 10(-2) Pa with 80-nm-diameter holes having an aspect ratio of 5.6. The results show that the optimal amount of added nitrogen for copper filling is 1.0 at.%, and that the proportion of conformal filling is 1/5. The reasons for this are discussed in terms of the energy relationship between copper atoms adsorbed physically or chemically by nitrogen, sputtered atoms, and recoil atoms or molecules.
引用
收藏
页码:736 / 738
页数:3
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