AES and XPS peaks shape

被引：0
|
作者：
Spanjard, D
机构：
来源：
VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 1996年 / 52卷 / 279期
关键词：
AES-XPS lines; broadening effects; electron correlation; plasmon excitation; electron hole creation; phonon excitation;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Auger and XPS spectra provide 3 types of information : peak energy shift informs on chemical environment of the emitting atom ; peak intensity depends on local geometry effects ; peak shape depends on coupling effects between the core hole and the metal excitations. The purpose of this paper is to study influence on XPS peak shapes of different coupling effects : optical excitation ; phonon creation ; electron-hole creation ; electronic correlations. Peak shape I(E) and broadening function f(E) are expressed taking into account these effects.
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页码：13 / &
页数：12
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