A 400 kHz, fast-sweep Langmuir probe for measuring plasma fluctuations

被引：37
|
作者：
Chiodini, G [1 ]
Riccardi, C
Fontanesi, M
机构：
[1] Univ Milano Bicocca, Dipartimento Fis, I-20126 Milan, Italy
[2] INFM, I-20126 Milan, Italy
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 06期
关键词：
D O I：
10.1063/1.1149828
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A novel, fast-sweep Langmuir probe has been constructed and successfully operated on "Thorello." It is based on a novel, dual channel circuit that compensates for stray capacitance and permits sweep speeds up to 400 kHz. The circuit response has been tested by measuring the known current-voltage characteristics of resistors and diodes. In addition, the probe has been used to measure the electron temperature and density as well as the plasma potential of plasmas generated in Thorello. A method of three-parameter curve fitting is used to analyze the time-dependent data. The measurements compare favorably with those derived from other standard probe techniques. (C) 1999 American Institute of Physics. [S0034-6748(99)03006-3].
引用
收藏
页码：2681 / 2688
页数：8
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