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- [2] Microscope mode secondary ion mass spectrometry imaging with a Timepix detector REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (01):
- [4] Secondary ion mass spectrometry on the helium ion microscope: A feasibility study of ion extraction JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2012, 30 (06):
- [5] Application of fast sensors to microscope mode spatial imaging mass spectrometry JOURNAL OF INSTRUMENTATION, 2011, 6
- [6] Microscope imaging mass spectrometry with a reflectron REVIEW OF SCIENTIFIC INSTRUMENTS, 2020, 91 (02):
- [7] MICROSCOPE IMAGING BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3): : 119 - 139