Automated intelligent mode selection for fast mode matching analysis of waveguide discontinuities

被引：0
|
作者：
Vale, CAW [1 ]
Meyer, P [1 ]
机构：
[1] Univ Stellenbosch, Dept Elect & Elect Engn, ZA-7600 Stellenbosch, South Africa
来源：
2001 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3 | 2001年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents a novel scheme for mode selection in mode matching problems. The technique is capable of reducing the size of a system considerably whilst retaining high accuracy. A procedure for efficient cascade analysis with the technique is also presented.
引用
收藏
页码：1949 / 1952
页数：4
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