Multi-contrast computed laminography at ANKA light source

被引：9
|
作者：
Cheng, Y. [1 ]
Altapova, V.
Helfen, L. [1 ]
Xu, F. [1 ]
Rolo, T. dos Santos [1 ]
Vagovic, P. [1 ]
Fiederle, M.
Baumbach, T. [1 ]
机构：
[1] Karlsruhe Inst Technol, Inst Photon Sci & Synchrotron Radiat, ANKA Light Source, D-76344 Karlsruhe, Germany
来源：
11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (XRM2012) | 2013年 / 463卷
关键词：
OBJECTS;
D O I：
10.1088/1742-6596/463/1/012038
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
X-ray computed laminography has been developed as a non-destructive imaging technique for inspecting laterally extended objects. Benefiting from a parallel-beam geometry, high photon flux of synchrotron sources and modern high-resolution detector systems, synchrotron radiation computed laminography (SRCL) results in a powerful three-dimensional microscopy technique. SRCL can be combined with different contrast modes, such as absorption, phase and dark-field contrasts, in order to provide complementary information for the same specimen. Here we show the development of SRCL at the TopoTomo beamline of the ANKA light source. A novel instrumentation design is reported and compared to the existing one. For this design, experimental results from different contrast modalities are shown.
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页数：4
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