Electromagnetic properties measurements of ferromagnetic materials using microstrip

被引：3

作者：

Hinojosa, J

Cottevieille, D

Le Mehaute, A

Faucon, L

机构：

[1] Univ Politecn Cartagena, Dept Elect Tecnol Comp & Proyectos, Cartagena 30202, Murcia, Spain

[2] Alcatel, Branche CRC, Etab Marcousis, F-91461 Marcoussis, France

[3] Inst Super Mat Mans, F-72000 Le Mans, France

[4] Univ Sci & Technol, Inst Elect & Microelect Nord, Dept Hyperfrequences & Semicond, UMR CNRS 9929, F-59652 Villeneuve Dascq, France

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2002年 / 33卷 / 03期

关键词：

S parameters; microstrip; petmittivity; permeability broadband measurement;

D O I：

10.1002/mop.10269.abs

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A broadband technique for the simultaneous measurement of the complex permittivity and permeability of film-shaped ferromagnetic materials is presented. Complex permittivity and permeability tire computed from S-parameter measurements under a constant exterior magnetic field of microstrip transmission lines used as cells. Moreover, a simple and fast technique that allows to the measurement of magnetic materials with a low, permeability. is presented, The measurement bench uses a vector network analyzer, a high-quality. on-microstrip test fixture, and an electromagnet. Measurements in the 0.05-20 GHz range show the validity of these methods. (C) 2002 Wiley Periodicals, Inc.

引用

页码：176 / 180

页数：5

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