An analytical density of states and joint density of states analysis of amorphous semiconductors

被引:29
|
作者
O'Leary, SK [1 ]
机构
[1] Univ Regina, Fac Engn, Regina, SK S4S 0A2, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1063/1.1778478
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the relationship between the density of states and joint density of states functions in amorphous semiconductors. Introducing an elementary empirical model for the density of states functions that captures the basic expected features, we determine analytical and asymptotic joint density of states results, relating the parameters characterizing the underlying density of states functions with the resultant joint density of states. Numerical joint density of states results, corresponding to the specific case of hydrogenated amorphous silicon, are also presented. It is suggested that this density of states and joint density of states analysis will prove of use to the experimentalist. (C) 2004 American Institute of Physics.
引用
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页码:3680 / 3686
页数:7
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