Optically detected cyclotron resonance by multichannel spectroscopy

被引：2
|
作者：
Suzuki, K
Saito, K
Saku, T
Hirayama, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1997年 / 36卷 / 02期
关键词：
ODCR; CR; FIR; multichannel spectroscopy; H-band; modulation doped;
D O I：
10.1143/JJAP.36.926
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We developed a novel setup which includes a multichannel detector for optically detected cyclotron resonance. It can be used to record all photoluminescence (PL) spectra under far-infrared radiation at various magnetic fields. Using this setup, intensity changes can be monitored as a function of the magnetic field simultaneously for all recombination peaks. This system is useful not only for high-sensitivity and high-resolution measurement of cyclotron resonance, but also for studying recombination processes.
引用
收藏
页码：926 / 929
页数：4
相关论文
共 50 条
  • [21] Optically detected cyclotron resonance studies of high electron mobility AlGaAs/GaAs structures
    Godlewski, M.
    Monemar, B.
    Anderson, T.G.
    Tsimperidis, I.
    Gregorkiewicz, T.
    Ammerlaan, C.A.J.
    Muszalski, J.
    Kaniewska, M.
    Acta Physica Polonica A, 1995, 88 (5 pt 1):
  • [22] Optically detected cyclotron resonance in a high mobility 2D electron gas
    Moreau, S.
    Byszewski, M.
    Sadowski, M. L.
    Potemski, M.
    Studenikin, S. A.
    Austing, G.
    Sachrajda, A. S.
    Saku, T.
    Hirayama, Y.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2006, 32 (1-2): : 203 - 206
  • [23] Coherent defect spectroscopy with pulsed optically and electrically detected magnetic resonance
    C. Boehme
    K. Lips
    Journal of Materials Science: Materials in Electronics, 2007, 18 : 285 - 291
  • [24] Coherent defect spectroscopy with pulsed optically and electrically detected magnetic resonance
    Boehme, C.
    Lips, K.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (Suppl 1) : S285 - S291
  • [25] OPTICALLY DETECTED CYCLOTRON-RESONANCE IN A GAAS/GA0.67AL0.33AS SUPERLATTICE
    CAVENETT, BC
    PAKULIS, EJ
    PHYSICAL REVIEW B, 1985, 32 (12): : 8449 - 8451
  • [26] OPTICALLY DETECTED CYCLOTRON-RESONANCE MEASUREMENTS IN ALO.48IN0.52AS MBE LAYERS
    WRIGHT, MG
    KANAAH, A
    CAVENETT, BC
    JOHNSON, GR
    DAVEY, ST
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1989, 4 (07) : 590 - 592
  • [27] Far-infrared optically-detected cyclotron resonance in InxGa1-xAs
    Nakata, H
    Shimizu, N
    Ohyama, T
    PROCEEDINGS OF THE 10TH INTERNATIONAL CONFERENCE ON NARROW GAP SEMICONDUCTORS AND RELATED SMALL ENERGY PHENOMENA, PHYSICS AND APPLICATIONS, 2001, 2 : 22 - 24
  • [28] Optically detected cyclotron resonance properties of high purity ZnSe epitaxial layers grown on GaAs
    Drechsler, M
    Meyer, BK
    Hofmann, DM
    Ruppert, P
    Hommel, D
    APPLIED PHYSICS LETTERS, 1997, 71 (08) : 1116 - 1117
  • [29] Hole effective masses in 4H SiC determined by optically detected cyclotron resonance
    Son, NT
    Hai, PN
    Chen, WM
    Hallin, C
    Monemar, B
    Janzén, E
    SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 563 - 566
  • [30] FAR-INFRARED OPTICALLY DETECTED CYCLOTRON-RESONANCE OBSERVATION OF QUANTUM EFFECTS IN GAAS
    WRIGHT, MG
    AHMED, N
    KOOHIAN, A
    MITCHELL, K
    JOHNSON, GR
    CAVENETT, BC
    PIDGEON, CR
    STANLEY, CR
    KEAN, AH
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1990, 5 (05) : 438 - 441
12345