Trace determination of Hg together with As, Sb, Se by miniaturized optical emission spectrometry integrated with chemical vapor generation and capacitively coupled argon microwave miniplasma discharge

A miniaturized optical emission spectrometer (OES) with capacitively coupled argon microwave microplasma (mu CMP) as and excitation source and chemical vapor generation (CVG) for sample introduction was constructed for the determination of trace Hg, As, Sb and Se. The applied method enabled simultaneous determination of hydride-forming elements (As, Sb, Se) and volatile Hg. Mercury cold vapor and the hydride volatile species of As, Sb and Se were generated when standard or sample solutions were separated from the liquid phase for transport to the capacitively coupled microwave microplasma and detection of their atomic emission. A univariate approach and the simplex optimization procedure were used to achieve optimized conditions and derive analytical figures of merit. The experimental concentration detection limits (LODs) for simultaneous determination, calculated as the concentration giving a signal equal to three times of the standard deviation of the blank (LOD, 3 sigma(blank) criterion, peak height) were 3.0, 1.4, 1.5 and 3.8 ng mL(-1) for Hg, As, Sb and Se, respectively. The method was validated by the analysis of three Certified Reference Materials (NIST 2711, NRCC DOLT-2, NIST 1643e) of different matrix composition and by the standard addition technique. The method offers relatively good precision (RSD ranged from 5% to 8%) for microsampling (200 mu L) analysis. The measured of contents of elements in certified reference materials were in good agreement with the certified values (Hg 1.99-6.25 mu g g(-1), As 16.6-105 mu g g(-1) 19.4-56.88 mu g g(-1), Se 1.52-11.68 mu g g(-1)), according to the Student t-test, for a confidence level of 95%. (C) 2017 Elsevier B.V. All rights reserved.