Dynamic Compaction in SAT-Based ATPG

被引：20

作者：

Czutro, Alexander ^{[1
]}

Polian, Ilia ^{[1
]}

Engelke, Piet ^{[1
]}

Reddy, Sudhakar M. ^{[2
]}

Becker, Bernd ^{[1
]}

机构：

[1] Univ Freiburg, Inst Comp Sci, D-79110 Freiburg, Germany

[2] Univ Iowa, ECE Dept, Iowa City, IA 52242 USA

来源：

2009 ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2009年

关键词：

SAT-based ATPG; Dynamic compaction; SATISFIABILITY; GENERATION;

D O I：

10.1109/ATS.2009.31

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures. yet often yields too large test sets. We present a dynamic compaction procedure for SAT-based ATPG which utilizes internal data structures of the SAT solver to extract essential fault detection conditions and to generate patterns which cover multiple faults We complement this technique by a state-of-the-art forward-looking reverse-order simulation procedure. Experimental results obtained for an industrial benchmark, circuit suite show: that the new, method outperforms earlier static approaches by approximately 23%.

引用

页码：187 / +

页数：2

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