Ultrafast carrier relaxation dynamics in single-layer cuprates

被引:41
|
作者
Schneider, ML
Demsar, J
Glinka, Y
Klimov, A
Krapf, A
Rast, S
Ren, YH
Si, WD
Xu, Y
Zeng, XH
Bozovic, I
Lüpke, G
Manzke, R
Sobolewski, R
Taylor, AT
Tolk, NH
Xi, XX
Joynt, R
Onellion, M
机构
[1] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA
[2] Los Alamos Natl Lab, Los Alamos, NM USA
[3] Vanderbilt Univ, Dept Phys, Nashville, TN 37235 USA
[4] Polish Acad Sci, Inst Phys, PL-02904 Warsaw, Poland
[5] Univ Rochester, Dept Elect & Comp Engn, Rochester, NY 14627 USA
[6] Univ Rochester, Laser Energet Lab, Rochester, NY 14627 USA
[7] Humboldt Univ, Inst Phys, D-10115 Berlin, Germany
[8] Coll William & Mary, Dept Appl Sci, Williamsburg, VA USA
[9] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
[10] OXXEL GmbH, D-28359 Bremen, Germany
来源
EUROPHYSICS LETTERS | 2002年 / 60卷 / 03期
关键词
D O I
10.1209/epl/i2002-00286-8
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using a femtosecond pump-probe optical technique, we measured the time-resolved change in reflectivity of three single-layer cuprate samples, including Bi2Sr2-xLaxCuO6+z, La2CuO4+y and La2-xSrxCuO4 grown on SrTiO3. We analyze the data in terms of a nonthermal electron relaxation model, and obtain quantitative agreement between the model and the data. The initial electron-electron thermalization process is much longer in the uperconducting samples as opposed to the overdoped nonsuperconducting sample, suggesting a bottleneck in electron thermalization process due to the presence of the superconducting gap.
引用
收藏
页码:460 / 466
页数:7
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