A PORTABLE MICROWAVE INTERFERENCE SCANNING SYSTEM FOR NONDESTRUCTIVE TESTING OF MULTI-LAYERED DIELECTRIC MATERIALS

被引：0
|
作者：
Schmidt, K. F., Jr. [1 ]
Little, J. R., Jr. [1 ]
Ellingson, W. A. [2 ]
Green, W. [3 ]
机构：
[1] Evisive Inc, Baton Rouge, LA USA
[2] Argonne Natl Lab, Argonne, IL USA
[3] Army Res Lab, Aberdeen Proving Ground, MD USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 28A AND 28B | 2009年 / 1096卷
关键词：
Microwave; NDT; Ceramics; Composites;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A portable, microwave interference scanning system, that can be used in situ, with one-sided, non-contact access, has been developed. It has demonstrated capability of damage detection on composite ceramic armor. Specimens used for validation included specially fabricated surrogates, and non-ballistic impact-damaged specimens. Microwave data results were corroborated with high resolution direct-digital x-ray imaging. Microwave interference scanning detects cracks, laminar features and material properties variations. This paper will present details of the system and discuss results obtained.
引用
收藏
页码：1107 / +
页数：2
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