Surface roughness evaluation by using wavelets analysis

被引：58
|
作者：
Chen, QH [1 ]
Yang, SN [1 ]
Li, Z [1 ]
机构：
[1] Huazhong Univ Sci & Technol, Res Ctr Measurement Technol & Sci Instruments, Wuhan 430074, Hubei, Peoples R China
来源：
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 1999年 / 23卷 / 03期
关键词：
wavelets analysis; surface roughness; evaluation reference;
D O I：
10.1016/S0141-6359(99)00013-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Based upon wavelets theory, a novel reference for evaluating surface roughness is proposed here, wherein the surface roughness can be separated from the actual surface profile f(t). Some examples have shown that more precise evaluation results could have been achieved than those found using classical reference lines. (C) 1999 Elsevier Science Inc. All rights reserved.
引用
收藏
页码：209 / 212
页数：4
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