Development of in-situ SEM torsion tester for microscale materials

被引:9
|
作者
Chen, Bo [1 ,3 ]
Yang, Rong [1 ]
Dong, Jie [3 ,4 ]
Wang, Sufang [1 ,3 ]
Wang, Jun [1 ,3 ]
Huan, Yong [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China
[2] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[3] Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China
[4] Chinese Acad Sci, Inst Phys, Beijing 100190, Peoples R China
基金
中国国家自然科学基金;
关键词
In-situ; Torsion test; Micro-scale; Metallic glass wire;
D O I
10.1016/j.measurement.2019.03.034
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An in-situ SEM (scanning electron microscope) micro-torsion tester with high resolution is developed based on electromagnetism. The torque is controlled and measured using a coil-magnet component. The torsion angle is measured by a non-contact transducer based on Hall-effect. The calibration results show that the torque capacity of this tester is 1.6 x 10(-4) Nm with resolution of 1 x 10(-9) Nm. In-situ torsion test of MG (metallic glass) wire (Pd40Cu30Ni10P20) with a diameter of 111 mu m and a length of 3 mm is performed using this tester in SEM. A linear torque-torsion angle curve is obtained and the calculated shear modulus of the sample is 24.7 GPa. Meanwhile, the deformation process of the sample is simultaneously observed using SEM. It is the first time that the measurement of shear stress-strain and high resolution morphology observation are carried out simultaneously. (C) 2019 Elsevier Ltd. All rights reserved.
引用
收藏
页码:421 / 425
页数:5
相关论文
共 50 条
  • [41] In-situ SEM compression of accordion-like multilayer MXenes
    Li, Yanxiao
    Wei, Congjie
    Huang, Shuohan
    Wu, Chenglin
    Mochalin, Vadym N.
    [J]. EXTREME MECHANICS LETTERS, 2020, 41
  • [42] Recovery of SEM image by in-situ cleaning of contaminated objective aperture
    Ohtoshi, K
    Ogasawara, M
    Sugihara, K
    Yamazaki, Y
    Miyoshi, M
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (07): : 4128 - 4132
  • [43] IN-SITU VARIATION OF HYDROGENIZED SI BY ELECTRON-IRRADIATION IN SEM
    KATZ, EA
    POLYAK, LE
    LUKYANOV, AE
    BUTYLKINA, NA
    [J]. IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1995, 59 (02): : 14 - 17
  • [44] Measurements of grain boundary mobility in aluminium by in-situ SEM experiments
    Huang, Y
    Humphreys, FJ
    [J]. GRAIN GROWTH IN POLYCRYSTALLINE MATERIALS III, 1998, : 431 - 436
  • [45] Development of fatigue testing system for in-situ observation of stainless steel 316 by HS-AFM & SEM
    Payam, Amir Farokh
    Payto, Oliver
    Picco, Loren
    Moore, Stacy
    Martin, Tomas
    Warren, A. D.
    Mostafavi, Mahmoud
    Knowles, David
    [J]. INTERNATIONAL JOURNAL OF FATIGUE, 2019, 127 : 1 - 9
  • [46] A novel laser powered heating stage for in-situ investigations in a SEM
    Kirch, D. M.
    Ziemons, A.
    Lischewski, I.
    Molodov, D. A.
    Gottstein, G.
    [J]. RECRYSTALLIZATION AND GRAIN GROWTH III, PTS 1 AND 2, 2007, 558-559 : 909 - +
  • [47] TEM and SEM in-situ annealing of nanocrystalline copper thin films
    Simoes, S.
    Calinas, R.
    Ferreira, P. J.
    Viana, F.
    Vieira, M. T.
    Vieira, M. F.
    [J]. MICROSCOPY AND MICROANALYSIS, 2008, 14 : 49 - 52
  • [48] Development of in-situ SEM testing apparatus for observing behavior of material at high magnification during tensile test
    Min, Hyeon-Gyu
    Park, Jun-Hyub
    [J]. MEASUREMENT, 2023, 221
  • [49] In situ SEM observation of microscale strain fields around a crack tip in polycrystalline molybdenum
    Li, J. J.
    Li, W. C.
    Jin, Y. J.
    Wang, L. F.
    Zhao, C. W.
    Xing, Y. M.
    Lang, F. C.
    Yan, L.
    Yang, S. T.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2016, 122 (06):
  • [50] In situ SEM observation of microscale strain fields around a crack tip in polycrystalline molybdenum
    J. J. Li
    W. C. Li
    Y. J. Jin
    L. F. Wang
    C. W. Zhao
    Y. M. Xing
    F. C. Lang
    L. Yan
    S. T. Yang
    [J]. Applied Physics A, 2016, 122