Effect of intrinsic stress on the optical properties of nanostructured ZnO thin films grown by rf magnetron sputtering

被引:129
|
作者
Kumar, Rajesh [1 ,2 ]
Khare, Neeraj [3 ]
Kumar, Vijay [1 ]
Bhalla, G. L. [2 ]
机构
[1] Natl Phys Lab, New Delhi 110012, India
[2] Univ Delhi, Dept Phys & Astrophys, Delhi 110007, India
[3] Indian Inst Technol, Dept Phys, New Delhi 110016, India
关键词
stress; optical properties; ZnO;
D O I
10.1016/j.apsusc.2008.04.012
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this paper we report the effect of deposition temperature on the structural and optical properties of ZnO thin films prepared by rf magnetron sputtering. The films grown at lower deposition temperatures were in a state of large compressive stress, whereas the films grown at higher temperature (450 degrees C) were almost stress free. In the absorption spectra, the ZnO excitonic and the Zn surface plasmon resonance (SPR) peaks have been observed. A redshift in the optical band gap of ZnO films has also been observed with the increase in the deposition temperature. The shift in the band gap calculated from the size effect did not match with the observed shift values and the observed shift has been attributed to the compressive stress present in the films. (C) 2008 Published by Elsevier B. V.
引用
收藏
页码:6509 / 6513
页数:5
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