Electrical breakdown of a dielectric for the formation of a superconducting nanocontact

被引：2
|
作者：
Bondarenko, S. I. [1 ]
Krevsun, A. V. [1 ]
Koverya, V. P. [1 ]
Sivakov, A. G. [1 ]
Galushkov, R. S. [1 ]
机构：
[1] Natl Acad Sci Ukraine, B Verkin Inst Low Temp Phys & Engn, UA-61103 Kharkiv, Ukraine
来源：
LOW TEMPERATURE PHYSICS | 2022年 / 48卷 / 09期
关键词：
superconducting bridges; electrical breakdown; Josephson properties; CONTACTS;
D O I：
10.1063/10.0013310
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Electrical breakdown of the dielectric nanolayer between film electrodes of niobium and an alloy of 50% indium and 50% tin forms a bridge of this alloy between the electrodes. The bridge resistance depends on the breakdown current. The length of the bridge is equal to the thickness of the dielectric (30 nm), and its diameter is 25 nm. The calculated coherence length of the alloy at 2 K is close to the length of the bridge. The calculated critical current of a bridge with a resistance of 1 omega at a temperature of 0 K is 1 mA. It is concluded that such a bridge should have the properties of a Josephson contact at a temperature lower than the critical temperature of the alloy (6.5 K). Published under an exclusive license by AIP Publishing.
引用
收藏
页码：741 / 745
页数：5
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